New Developments in Multi-channel Test Systems,#391

Author(s):

• Bono,R.W. ( The Modal Shop,Inc )
• Dillon,M.J.
• Gatzwiller,K.B.
• Brown,D.L.

Publication title:

Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3727

Pub. Year:

1999

Vol.:

Part1

Page(from):

518

Page(to):

524

Pub. info.:

Bethel, CT: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780912053646 [091205364X]

Language:

English

Call no.:

P63600/3727

Type:

Conference Proceedings