Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs

Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs

Author(s):

Wright,S.L. ( IBM Thomas J.Watson Research Ctr. )
Millman,S.
Kodate,M.

Publication title:

Flat panel display technology and display metrology : 27-29 January 1999, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3636

Pub. Year:

1999

Page(from):

200

Page(to):

211

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819431073 [0819431079]

Language:

English

Call no.:

P63600/3636

Type:

Conference Proceedings

Details

TDL ID:	ZA00016672
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Flat Panel Display Technology and Display Metrology
Conf. info. (Number):	1999
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1999.01.27-1999.01.29

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