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New uniformity measurement method for LCD panels

Author(s):
Leroux,T.R. ( Eldim )  
Publication title:
Flat panel display technology and display metrology : 27-29 January 1999, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3636
Pub. Year:
1999
Page(from):
191
Page(to):
198
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431073 [0819431079]
Language:
English
Call no.:
P63600/3636
Type:
Conference Proceedings

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