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Reliability and degradation mechanisms of high-power diode lasers

Author(s):
Publication title:
Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3626
Pub. Year:
1999
Page(from):
217
Page(to):
221
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430960 [081943096X]
Language:
English
Call no.:
P63600/3626
Type:
Conference Proceedings

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