Direct spectroscopic measurement of packaging-induced strains in high-power laser diode arrays
- Author(s):
Tomm,J.W. ( Max-Born-Institut fur Nichtlineare Optik und Kurzzeitspektroskopie ) Muller,R. Barwolff,A. Neuner,M. Elsaesser,T. Lorenzen,D. Daiminger,F.X. Gerhardt,A. Donecker,J. - Publication title:
- Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3626
- Pub. Year:
- 1999
- Page(from):
- 138
- Page(to):
- 147
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819430960 [081943096X]
- Language:
- English
- Call no.:
- P63600/3626
- Type:
- Conference Proceedings
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