Blank Cover Image

Simple device to measure laser mirror parameters

Author(s):
Prakash,O. ( National Physical Lab. )  
Publication title:
Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3626
Pub. Year:
1999
Page(from):
23
Page(to):
27
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430960 [081943096X]
Language:
English
Call no.:
P63600/3626
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Simple Design to Measure the Scattering Factor of Laser Mirrors,

Prakash,Om

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Setup for measuring CuBr laser beam parameters

Kocik,M., Mohamed-Seghir,M., Mizeraczyk,J.

SPIE - The International Society for Optical Engineering
2 Conference Proceedings Infrared objectives of thermal vision devices and laser means of measuring their parameters

Ivanov, V. P., Bugayenko, A. G., Lukin, A. V., Melnikov, A. N., Morozov, A. E.

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Device for laser beam intensity real time measuring

Margaryan, H.L., Aroutiounian, V.M., Meliksetyan, V.A., Darbasyan, A.T., Arakelyan, A.H., Khalaytan, A.V., Tabirian, …

SPIE - The International Society of Optical Engineering
3 Conference Proceedings A Simple Device for Measuring Losses in Soft Magnetic Materials

W.S. Marinho, M.F. de Campos, J.C. Teixeira

Trans Tech Publications
9 Conference Proceedings Determining the Calibration Life of Measuring Devices by Means of Parameter Deviation Function

Clinciu, Ramona

Trans Tech Publications
4 Conference Proceedings Characterization device for measuring beam parameter product and beam quality of collimated and uncollimated diode lasers [6101-27]

Roehner, M., Boucke, K., Poprawe, R.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Device USB interface and software development for electric parameter measuring instrument

Li, D., Chen, J., Wu, Y.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Simple laser interferometers for concave ellipsoidal mirror testing

Popov, G.M., Popov, Y.G.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Four-mirror two-frequency He-Ne laser for heterodyne measuring systems

Gudelev,V.G., Klochko,A.I., Zhurik,Yu.P.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Laser-based sensor for measuring drifting-snow parameters

Gupta,A.K., Kumar,V., Vashisth,P., Nijhawan,O.P.

SPIE - The International Society for Optical Engineering
12 Conference Proceedings A Simple Correlation Between the Geometry of Laser Cladding Tracks and the Process Parameters

Colaco R., Costa L., Guerra R., Vilar R.

Kluwer Academic Publishers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12