Blank Cover Image

Measuring Interfacial Fracture Toughness with the Blister Test

Author(s):
Publication title:
Thin films, stresses and mechanical properties VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
436
Pub. Year:
1997
Page(from):
115
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993396 [1558993398]
Language:
English
Call no.:
M23500/436
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings BLISTER TEST ANALYSIS METHODS

Hohlfelder, Robert J., Vlassak, Joost J., Nix, William D., Luo, Huihong, Chidsey, Christopher E. D.

MRS - Materials Research Society

Goolsby D. R., Miller M. J.

Society of Plastics Engineers, Inc. (SPE)

Sizemore, Jim, Hohlfelder, R. J., Vlassak, J. J., Nix, W. D.

Materials Research Society

Small, Martha K., Vlassak, Joost J., Powell, Stephen F., Daniels, Brian J., Nix, William D.

MRS - Materials Research Society

Paviot, V. M., Vlassak, J. J., Nix, W. D.

MRS - Materials Research Society

Guo, H., Hendrix, B. C., Zhu, X. D., Xu, K. W., He, J. W.

MRS - Materials Research Society

Small, Martha K., Vlassak, Joost J., Nix, William D.

Materials Research Society

L. Wang, Y.J. Sun, J.H. Luo, Y.G. Zhu, P.W. Niu

Trans Tech Publications

Vlassak, Joost J., Tsui, T. Y., Nix, W. D.

MRS - Materials Research Society

11 Conference Proceedings THE SEARCH FOR THE SUPERMODULUS EFFECT

Baker P. S., Small K. M., Vlassak J. J., Daniels J. B., Nix D. W.

Kluwer Academic Publishers

Chu, Y.Z., Jeong, H.S., White, R.C., Durning, C.J.

Materials Research Society

Lazar, D.R.R., Menezes, C.A.B., Ussui, V., Fancio, E., Lima, N.B., Bressiani, A.H.A., Paschoal, J.O.A.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12