Blank Cover Image

Continuum Elastic Strain Effects at Semiconductor Interfaces

Author(s):
Pearsall, T. P.  
Publication title:
Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
405
Pub. Year:
1996
Page(from):
309
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993082 [1558993088]
Language:
English
Call no.:
M23500/405
Type:
Conference Proceedings

Similar Items:

Pearsall P.T.

Kluwer Academic Publishers

Feldman, L. C., Bevk, J., Davidson, B. A., Gossman, H.-J., Ourmazd, A., Pearsall, T. P., Zinke-Allmang, M.

Materials Research Society

Pearsall, T. P.

Electrochemical Society

Gerberich, W. W., Angelo, J. E., Keller, R. R., Wowchak, A. M., Cohen, P. I.

Materials Research Society

Pearsall, T.P.

Materials Research Society

A. C. Diebold, P. Y. Hung, J. Price, B. Foran, H. Celio, T. Kelly

Electrochemical Society

Pearsall. P.T

Plenum Press

Schindler, A.C., Vvedensky, D.D., Gyure, M.F., Simms, G.D., Caflisch, R.E., Connell, C.

Kluwer Academic Publishers

Pearsall, T. P.

MRS - Materials Research Society

A. Badakhshan, P. Thompson, P. Cheung

Society of Photo-optical Instrumentation Engineers

T. P. Pearsall

Society of Photo-optical Instrumentation Engineers

Bergenti, I., Biscarini, F., Cavallini, M., Dediu, V., Murgia, M., Nozar, P., Ruani, G., Taliani, C.

Kluwer Academic Publishers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12