Blank Cover Image

Electrical Measurements of Microwave Flip-Chip Interconnections

Author(s):
Publication title:
Proceedings : 1995 International Symposium on Microelectronics, October 24-26, 1995, Los Angels Convention Center, Los Angeles, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2649
Pub. Year:
1995
Page(from):
424
Page(to):
429
Pub. info.:
Reston, VA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780930815448 [0930815440]
Language:
English
Call no.:
P63600/2649
Type:
Conference Proceedings

Similar Items:

Cheah,L.K., Tan,Y.M., Wei,J., Wong,C.K.

SPIE-The International Society for Optical Engineering

Chai, Kevin, Wu, Eddy, Hsieh, Roger, Tong, J.Y.

IMAPS

Vusirikala,V., Heim,P.J.S., Dagenais,M., McClay,C.P.

SPIE-The International Society for Optical Engineering

Paydenkar,Chetan, Baldwin,Daniel, Sitaraman,Suresh, Wong,C.P., Lewia,Brian

IMAPS, SPIE-The International Society for Optical

Hung,C.P., Wu,Larry, Chiu,C.T., Hsieh,J.S., Lee,J.J.

IMAPS

Yap, K.P., Cui, C.Q., Lahiri, S.K.

Electrochemical Society

Loboda,Mark, Camilletti,R.C., Goodman,L.A., White,L., Pinch,H.L., Shaw,J., Patel,V.K., Wu,C.P., Adema,G.M.

SPIE-The International Society for Optical Engineering

Yamada,Hiroshi., Togasaki,T., Tateyama,K., Higuchi,K.

IMAPS

Chen,H.N., Wu,C.T., Lin,P.J., Hung,S.C.

IMAPS

Hsu, D.I., Kim, H.K., Shi, F.G., Chungpaiboonpatana, S., Davidson, C., Adams, J.M.

Electrochemical Society

Roger B. Marks, Dylan F. Williams

Society of Photo-optical Instrumentation Engineers

O'Brien, D.C., Faulkner, G.E., Zyambo, E.B., Edwards, D.J., Stavrinou, P.N., Parry, G., Bellon, J., Sibley, M.J.N., …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12