Li, C., Stair, P. C.
Elsevier
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Yu, Jia., Liu, Z., Xin, Q., Li, C.
Elsevier
|
Alshuth T., Hildebrandt P., Stockburger M.
D. Reidel
|
Schulze, H. G., Bass, A., Addison, C., Hughesman, C., So, A. P., Haynes, C. A., Blades, M. W., Turner, R. F. B.
SPIE - The International Society of Optical Engineering
|
|
Li, G., Zhang, G., Chen, C.
SPIE - The International Society of Optical Engineering
|
Zhao,X., Vinson,M.A., Malins,D.C., Spiro,T.G.
SPIE - The International Society for Optical Engineering
|
Moskovits, M., Lella, D. P. Di
American Chemical Society
|
Boustany,N.N., Manoharan,R., Dasari,R.R., Feld,M.S., Harrison,George R.
SPIE-The International Society for Optical Engineering
|
Kunlun Ding, Peter C. Stair
American Institute of Chemical Engineers
|
KUIVILA, C.S., BUTT, J.B., STAIR, P.
American Institute of Chemical Engineers
|
Kunlun Ding, Peter C. Stair
American Institute of Chemical Engineers
|