TEM Investigation of Point Defect Interactions in II-VI Compounds
- Author(s):
- Publication title:
- Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
- Title of ser.:
- Materials science forum
- Ser. no.:
- 196-201
- Pub. Year:
- 1995
- Pt.:
- 3
- Page(from):
- 1461
- Page(to):
- 1466
- Pub. info.:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497164 [0878497161]
- Language:
- English
- Call no.:
- M23650
- Type:
- Conference Proceedings
Similar Items:
MRS - Materials Research Society |
7
Conference Proceedings
Native Point Defect Interactions in ZGP Crystals under Influence of e-Beam Irradiation
Materials Research Society |
MRS - Materials Research Society |
8
Conference Proceedings
Calculations of Equilibrium Critical Thickness for Non-Polar Wurtzite InGaN/GaN Systems
Trans Tech Publications |
MRS - Materials Research Society |
9
Conference Proceedings
Influence of Intrinsic Elastic Stresses on the Interaction between Point Defects in Si
Trans Tech Publications |
Trans Tech Publications |
MRS - Materials Research Society |
MRS - Materials Research Society |
11
Conference Proceedings
A TEM Investigation of Crack Reduction in AlGaN/GaN Heterostructures Using an AlN Interlayer
Materials Research Society |
6
Conference Proceedings
Local Electronic Structure of Defects in GaN From Spatially Resolved Electron Energy-Loss Spectroscopy
MRS - Materials Research Society |
MRS - Materials Research Society |