Polarization measurements of the light scattered by dielectric randomly rough isotropic surfaces

Polarization measurements of the light scattered by dielectric randomly rough isotropic surfaces

Author(s):

Chaikina, E.I. ( Centro de Investigacion Cientifica y de Educacion Superior de Ensenada, Mexico )
Negrete-Regagnon, P.
Martinez-Niconoff, G.
Mendez, E.R.

Publication title:

Scattering and surface roughness II : 21-23 July 1998, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3426

Pub. Year:

1998

Page(from):

153

Page(to):

159

Pub. info.:

Bellingham, Wash.: SPIE

ISSN:

0277786X

ISBN:

9780819428813 [0819428817]

Language:

English

Call no.:

P63600/3426

Type:

Conference Proceedings

Details

TDL ID:	ZA00016479
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Scattering and Surface Roughness
Conf. info. (Number):	1998 : 2nd
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1998.07.21-1998.07.23

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