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Camera model and calibration process for high-accuracy digital image metrology of inspection planes

Author(s):
Publication title:
Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3521
Pub. Year:
1998
Page(from):
42
Page(to):
53
Pub. info.:
Bellingham: SPIE
ISSN:
0277786X
ISBN:
9780819429827 [0819429821]
Language:
English
Call no.:
P63600/3521
Type:
Conference Proceedings

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