Blank Cover Image

Estimation of fault parameters of stratified structures based on wavelet packet algorithm in free-oscillation testing method

Author(s):
Publication title:
Wavelet applications IV : 22-24 April 1997, Orlando, Florida
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3078
Pub. Year:
1997
Page(from):
162
Page(to):
169
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819424938 [0819424935]
Language:
English
Call no.:
P63600/3078
Type:
Conference Proceedings

Similar Items:

Kim,M., Baek,J., Kim,S., Lee,G.

SPIE-The International Society for Optical Engineering

Shan, H., Guo, J., Ma, S., Hao, X.

SPIE - The International Society of Optical Engineering

S. Choi, Z. Jiang

Society of Photo-optical Instrumentation Engineers

X. Ren, W. Shao, W. Ma

Society of Photo-optical Instrumentation Engineers

3 Conference Proceedings Multiplexing based on wavelet packets

J. Wu, Q. Jin, K.M. Wong

Society of Photo-optical Instrumentation Engineers

Wang, Xin, Xu, Juan, Zhang, Guo Dong, Qi, Rui Min

Trans Tech Publications

Bae, J.-W., Lee, S.-H., Yoo, J.-S.

SPIE - The International Society of Optical Engineering

Zhou, Ye, Pan, Luo Ping, Li, Ping Ping

Trans Tech Publications

Wang, Sheng Chun, Shen, Rong Sheng, Song, Shi Jun, Tian, Yan

Trans Tech Publications

Suite M. R, Burns H. R, Moore C. I, Stell M. F, Wasiczko L., Freeman W., Rabinovich W. S, Gilbreath G. C, Scharpf W. J

SPIE - The International Society of Optical Engineering

Li, H., Sun, H.-M., Song, G.

SPIE - The International Society of Optical Engineering

Dragotti,P.L., Vetterli,M.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12