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Transient inversion XUV lasers in Ti and Ge (Invited Paper)

Author(s):
Nickles,P.V. ( Max-Born-Institut (FRG) )
Schnurer,M. ( Max-Born-Institut (FRG) )
Kalachnikov,M.P. ( Max-Born-Institut (FRG) )
Sandner,W. ( Max-Born-Institut (FRG) )
Shlyaptsev,V.N. ( Colorado State Univ. )
Danson,C.N. ( Rutherford Appleton Lab. (UK) )
Neely,D. ( Rutherford Appleton Lab. (UK) )
Wolfrum,E. ( Rutherford Appleton Lab. (UK) )
Zhang,J. ( Rutherford Appleton Lab. (UK) )
Behjat,A. ( Univ.of Essex (UK) )
Demir,A. ( Univ.of Essex (UK) )
Tallents,G.J. ( Univ.of Essex (UK) )
Warwick,P.J. ( Queen's Univ.of Belfast (UK) )
Lewis,C.L.S. ( Queen's Univ.of Belfast (UK) )
9 more
Publication title:
Soft X-ray lasers and applications II : 28-29 July, 1997, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3156
Pub. Year:
1997
Page(from):
80
Page(to):
85
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425782 [0819425788]
Language:
English
Call no.:
P63600/3156
Type:
Conference Proceedings

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