Coupling between hot-carrier degradation modes of pMOSFETs
- Author(s):
- Janapaty,V. ( Vanderbilt Univ. )
- Bhuva,B.L. ( Vanderbilt Univ. )
- Bui,N. ( Advanced Micro Devices,Inc. )
- Kerns,S.E. ( Vanderbilt Univ. )
- Publication title:
- Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3216
- Pub. Year:
- 1997
- Page(from):
- 145
- Page(to):
- 148
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819426482 [0819426482]
- Language:
- English
- Call no.:
- P63600/3216
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
8
Conference Proceedings
Enhanced Degradation in P+-Poly PMOSFETs With Oxynitride Gate Dielectrics Under Hot-Hole Injection
MRS - Materials Research Society |
3
Conference Proceedings
Design and process issues affecting performance of optical interconnects on Ics
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Numerical simulations of the relative performance of streak-tube,range-gated,and PMT-based airborne imaging lidar systems with realistic sea surfaces
SPIE - The International Society for Optical Engineering |
5
Conference Proceedings
Enhanced hot-carrier-induced degradation of 0.25-jim P-MOSFETs with oxide/nitride composite spacer compared to those with oxide spacer
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Effect of LDD overlap on transistor self latch-up and on hot carrier degradation
Electrochemical Society |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |