Breakdown mechanisms in Al(GaN) MSM photodetectors

Breakdown mechanisms in Al(GaN) MSM photodetectors

Author(s):

Ferguson,I.T. ( EMCORE Corp. )

Schurman,M.J. ( EMCORE Corp. )

Karlicek,R.F.,Jr. ( EMCORE Corp. )

Feng,Z.C. ( EMCORE Corp. )

Liang,S. ( Rutgers Univ. )

Lu,Y. ( Rutgers Univ. )

Joseph,C.L. ( Rutgers Univ. )

2 more

Publication title:

Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3287

Pub. Year:

1998

Page(from):

221

Page(to):

226

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819427267 [0819427268]

Language:

English

Call no.:

P63600/3287

Type:

Conference Proceedings

Details

TDL ID:	ZA00016453
Series ID:	PA00000029
Conf. info. (Name):	Photonics West : Photodetectors
Conf. info. (Number):	1998 : 3rd
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1998.01.28-1998.01.30

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