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Diagnostics of noncrystalline films by using interference of Raman signals in thin and superthin films

Author(s):
Mitsa,V.M. ( Uzhgorod State Univ.(Ukraine) )  
Publication title:
International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3359
Pub. Year:
1998
Page(from):
389
Page(to):
392
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428080 [0819428086]
Language:
English
Call no.:
P63600/3359
Type:
Conference Proceedings

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