Pattern recognition with fast feature extraction
- Author(s):
- Nakhodkin,M.G. ( Kiev Univ.(Ukraine) )
- Musatenko,Yu.S. ( Kiev Univ.(Ukraine) )
- Kurashov,V.N. ( Kiev Univ.(Ukraine) )
- Publication title:
- Optical memory and neural networks : optical information science & technology '97 : 27-30 August 1997, Moscow, Russia
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3402
- Pub. Year:
- 1998
- Page(from):
- 333
- Page(to):
- 343
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819428523 [0819428523]
- Language:
- English
- Call no.:
- P63600/3402
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Model of a satellite-based earthquake precursor recognition system (Poster)
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Comparison of wavelet and Karhunen-Loeve representation in texture applications
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Optical field analysis by means of reduced Karhunen-Loeve representation with full element accounting
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Application of strong zerotrees to compression of correlated MRI image sets
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Video compression based on enhanced EZW scheme and Karhunen-Loeve transform
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Nonlinear improvement of Karhunen-Loeve bases obtained by approximate 2D procedures
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Correlated image set compression system based on new fast efficient algorithm of Karhunen-Loeve transform
SPIE |
SPIE - The International Society for Optical Engineering |
SPIE |