Reliability comparison of GaAIAsIGaAs and aluminum-free high-power laser diodes (Invited Paper)

Reliability comparison of GaAIAsIGaAs and aluminum-free high-power laser diodes (Invited Paper)

Author(s):

Pendse,D.R. ( Polaroid Corp. (USA) )
Chin,A.K. ( Polaroid Corp. (USA) )
Dabkowski,F.P. ( Polaroid Corp. (USA) )
Clausen,E.M. ( Polaroid Corp. (USA) )

Publication title:

Semiconductor Lasers III

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3547

Pub. Year:

1998

Page(from):

79

Page(to):

85

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819430083 [0819430080]

Language:

English

Call no.:

P63600/3547

Type:

Conference Proceedings

Details

TDL ID:	ZA00016437
Series ID:	PA00000029
Conf. info. (Name):	Photonics China : Semiconductor Lasers
Conf. info. (Number):	1998 : 3rd
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	1998.09.16-1998.09.18

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