Capani, P.M., Matz, P.D., Mueller, D.W., Kim, M.J., Walter, E.R., Rhoad, J.T., Busch, E.L., Reidy, R.F.
Materials Research Society
|
Kim, J. -S., Lee, S. -B., Choi, M. -J., K, Y., Lee, K. -W.
Elsevier
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Cumpston, B. H., Jensen, K. F., Klavetter, F., Staring, E. G. J., Demandt, R. C. J. E.
MRS - Materials Research Society
|
Sorrentino, Laura. L., Savelski, Mariano J., Farrell, Stephanie
American Institute of Chemical Engineers
|
H.S. Ganapathy, H.S. Hwang, Y.T. Jeong, K.T. Lim
Elsevier
|
Farshad Tabasinejad, Y. Barzin, R. G. Moore, S. A. Mehta, K. V. Fraassen
American Institute of Chemical Engineers
|
Jeon, J. -K., Ihm, S. -K., Park, Y. -K., Kim, J. S., Dong, J. -I., Kim, S., Kim, J. M., Kim, S. -S., Yoo, K. -S.
Elsevier
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Yang, S.-H., Choi, Y.-H., Park, J.-R., Kim, Y.H., Choi, S.-W., Sohn, J.-M.
SPIE-The International Society for Optical Engineering
|
Mark L. Dietz, Daniel R. McAlister, Dominique Stepinski, Peter R. Zalupski, Julie A. Dzielawa, Richard E. Barrans, Jr., …
American Chemical Society
|
Huang, S. H., Radosz, M.
American Institute of Chemical Engineers
|
Kim, Y.J., Noh, Y.M., Choi, S.C., Lee, C.K., Jung, J.S., Lee, H.L., Kim, J.E., Kim, K.W., Kim, M.J., He, Z., Ogunjobi, …
SPIE - The International Society of Optical Engineering
|
Xu, Y.H., Teo, B.K., Wu, H.M., Guo, S.L., He, Y.K., Chen, H.Y., Qian, W., Wu, S.J., Zuo, Y.H.
Materials Research Society
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